Title :
Crossbar RRAM Arrays: Selector Device Requirements During Write Operation
Author :
Sungho Kim ; Jiantao Zhou ; Lu, Wei D.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
Abstract :
A comprehensive analysis of write operations (SET and RESET) in a resistance-change memory (resistive random access memory) crossbar array is carried out. Three types of resistive switching memory cells-nonlinear, rectifying-SET, and rectifying-RESET-are compared with each other in terms of voltage delivery, current delivery, and power consumption. Two different write schemes, V/2 and V/3, were considered, and the V/2 write scheme is preferred due to much lower power consumption. A simple numerical method was developed that simulates entire current flows and node voltages within a crossbar array and provides a quantitative tool for the accurate analysis of crossbar arrays and guidelines for developing reliable write operation.
Keywords :
read-only storage; reliability; V/2 write scheme; V/3 write scheme; crossbar RRAM arrays; current delivery; resistive random access memory; resistive switching memory cells; selector device requirements; voltage delivery; write margin; write operation; write voltage window; Arrays; Junctions; Leakage currents; Power demand; Reliability; Resistance; Switches; Crossbar; resistive random access memory (RRAM); selector device; sneak path; write margin; write scheme; write scheme.;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2014.2327514