On the sensitivity of probe-corrected spherical near-field antenna measurements with high-order probes using double phi-step theta-scanning scheme against various measurement uncertainties

In this paper, the relatively recently introduced double phi-step theta-scanning scheme and the probe correction technique associated with it is examined against the traditional phi-scanning scheme and the first-order probe correction. The important result of this paper is that the double phi-step theta-scanning scheme is shown to be clearly less sensitive to the probe misalignment errors compared to the phi-scanning scheme. The two methods show similar sensitivity to noise and channel balance error.