DocumentCode :
547197
Title :
Fuzzy predictive R2R control to CMP process
Author :
Wang, Liang ; Hu, Jingtao
Author_Institution :
Key Lab. of Ind. Inf., Chinese Acad. of Sci., Shenyang, China
Volume :
2
fYear :
2011
fDate :
10-12 June 2011
Firstpage :
6
Lastpage :
10
Abstract :
For chemical mechanical polishing (CMP) process characteristics of nonlinear, time-varying and not easily being in-situ measured, this paper proposes a CMP process fuzzy predictive run-to-run (R2R) controller named FPR2R. CMP T-S fuzzy predictive model is off-line and on-line identified by algorithms of fuzzy clustering and recursive least squares with forgetting factor, thus problem of constructing accurate mathematical model of complicated CMP is solved and error of modeling is reduced. Recipe is calculated by multivariable generalized predictive control (GPC) method, therefore it improves control precision. Simulation results illustrate that proposed CMP FPR2R controller is better than EWMA control scheme about performance, variation in various runs of products is reduced substantially, process drifts and shifts is suppressed significantly. Compared to EWMA, root mean squared error for material removal rate (MRR) is decreased.
Keywords :
chemical mechanical polishing; fuzzy control; least squares approximations; predictive control; recursive estimation; CMP FPR2R controller; CMP T-S fuzzy predictive model; chemical mechanical polishing process; forgetting factor; fuzzy clustering; fuzzy predictive run-to-run controller; material removal rate; mathematical model; modeling error; multivariable generalized predictive control method; nonlinear characteristics; recursive least squares; root mean squared error; time varying characteristics; Manufacturing; Mathematical model; Optimization; Predictive control; Predictive models; Semiconductor device modeling; T-S fuzzy predictive model; chemical mechanical polishing; generalized predictive control; run-to-run control; semiconductor manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Science and Automation Engineering (CSAE), 2011 IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-8727-1
Type :
conf
DOI :
10.1109/CSAE.2011.5952412
Filename :
5952412
Link To Document :
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