• DocumentCode
    54770
  • Title

    Report to TIM Editor on CPEM 2012

  • Author

    Jarrett, Dean G.

  • Author_Institution
    National Institute of Standards and Technology, Gaithersburg, MD, USA
  • Volume
    62
  • Issue
    6
  • fYear
    2013
  • fDate
    Jun-13
  • Firstpage
    1396
  • Lastpage
    1396
  • Abstract
    CPEM 2012 is a biennial scientific event devoted to topics related to electromagnetic measurements at the highest accuracy levels. These cover the frequency spectrum from dc through the optical region. A major focus of CPEM is quantum devices that relate electrical standards to fundamental constants and the international system of units. CPEM presenters were encouraged to submit full-length papers on their work to the editors of this special issue devoted to the topic of precision electromagnetic measurements. The 2012 CPEM was held at the Gaylord National Resort at National Harbor just outside of Washington D.C. from 1-6 July 2012. The National Institute of Standards and Technology (NIST) led the Local Organizing Committee and teamed with the NCSL International and Centro Nacional de Metrologia (CENAM) to organize CPEM 2012. CPEM was attended by 396 metrologists, physicists, and engineers from National measurement institutes, industry, and universities. Over 75% of the attendees came from 40 countries outside the U.S. to attend CPEM 2012. It was a pleasure to welcome attendees back to the Washington D.C. area, especially during the national holiday as had been done 14 years earlier at CPEM 1998. The next CPEM will be held in Rio de Janeiro, Brazil, from 24 to 29 August 2014 hosted by the Instituto Nacional de Metrologia, Qualidade e Tecnologia (Inmetro), in cooperation with the Instituto Nacional de Tecnologica Industrial of Argentina.
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2013.2260637
  • Filename
    6514984