Title :
Research of REA failures according to their production defectiveness level
Author :
Nedostup, L. ; Kiselychnyk, M. ; Zayarniuk, P.
Author_Institution :
Theor. Radioengineering & Radiomeasuring Dept., Lviv Polytech. Nat. Univ., Lviv, Ukraine
Abstract :
The process of partial defectiveness forming is considered in this paper. The research of radio-electronic apparatus failures due to reasons of production defectiveness was made and analytic dependences of products reliability indexes from the assumed defectiveness were received. The received results can be used in developing and optimization of mathematical models of reliability forming processes.
Keywords :
electronics industry; forming processes; probability; reliability; REA failure; partial defectiveness forming process; product reliability index; production defectiveness level; radioelectronic apparatus failure; reliability forming processes; Additives; Indexes; Mathematical model; Optimization; Process control; Production; Reliability; defectiveness; failures intensity; faultlessness; probability of faultlessness working; probability of the defects skipping; reliability;
Conference_Titel :
Perspective Technologies and Methods in MEMS Design (MEMSTECH), 2011 Proceedings of VIIth International Conference on
Conference_Location :
Polyana
Print_ISBN :
978-1-4577-0639-4
Electronic_ISBN :
978-966-2191-18-9
