Research of REA failures according to their production defectiveness level

Author

Nedostup, L. ; Kiselychnyk, M. ; Zayarniuk, P.

Author_Institution

Theor. Radioengineering & Radiomeasuring Dept., Lviv Polytech. Nat. Univ., Lviv, Ukraine

fYear

2011

fDate

11-14 May 2011

Firstpage

86

Lastpage

87

Abstract

The process of partial defectiveness forming is considered in this paper. The research of radio-electronic apparatus failures due to reasons of production defectiveness was made and analytic dependences of products reliability indexes from the assumed defectiveness were received. The received results can be used in developing and optimization of mathematical models of reliability forming processes.

Keywords

electronics industry; forming processes; probability; reliability; REA failure; partial defectiveness forming process; product reliability index; production defectiveness level; radioelectronic apparatus failure; reliability forming processes; Additives; Indexes; Mathematical model; Optimization; Process control; Production; Reliability; defectiveness; failures intensity; faultlessness; probability of faultlessness working; probability of the defects skipping; reliability;

fLanguage

English

Publisher

ieee

Conference_Titel

Perspective Technologies and Methods in MEMS Design (MEMSTECH), 2011 Proceedings of VIIth International Conference on

Conference_Location

Polyana

Print_ISBN

978-1-4577-0639-4

Electronic_ISBN

978-966-2191-18-9

Type

conf

Filename

5960281