Title :
Variability-Aware Parametric Yield Estimation for Analog/Mixed-Signal Circuits: Concepts, Algorithms, and Challenges
Author :
Fang Gong ; Hao Yu ; Yiyu Shi ; Lei He
Abstract :
Accurate yield estimation is always an important director of design. For analog/mixed signal circuits, the dominant yield loss mechanisms are parametric in nature. This paper provides an informative discussion of varied approaches to parametric yield estimation, including recently developed methods that provide a highly accurate and fast alternative to Monte Carlo methods for some types of analysis.
Keywords :
Monte Carlo methods; estimation theory; mixed analogue-digital integrated circuits; Monte Carlo method; analog-mixed-signal circuit; loss mechanism; parametric yield estimation; variability-aware parametric yield estimation; Circuit simulation; Mixed analog digital integrated circuits; Monte Carlo methods; Process planning; Runtime; SRAM cells; Transistors; Yield estimation; Process variation; circuit simulation; monte carlo; yield analysis;
Journal_Title :
Design & Test, IEEE
DOI :
10.1109/MDAT.2014.2299279
