DocumentCode
54883
Title
Variability-Aware Parametric Yield Estimation for Analog/Mixed-Signal Circuits: Concepts, Algorithms, and Challenges
Author
Fang Gong ; Hao Yu ; Yiyu Shi ; Lei He
Volume
31
Issue
4
fYear
2014
fDate
Aug. 2014
Firstpage
6
Lastpage
15
Abstract
Accurate yield estimation is always an important director of design. For analog/mixed signal circuits, the dominant yield loss mechanisms are parametric in nature. This paper provides an informative discussion of varied approaches to parametric yield estimation, including recently developed methods that provide a highly accurate and fast alternative to Monte Carlo methods for some types of analysis.
Keywords
Monte Carlo methods; estimation theory; mixed analogue-digital integrated circuits; Monte Carlo method; analog-mixed-signal circuit; loss mechanism; parametric yield estimation; variability-aware parametric yield estimation; Circuit simulation; Mixed analog digital integrated circuits; Monte Carlo methods; Process planning; Runtime; SRAM cells; Transistors; Yield estimation; Process variation; circuit simulation; monte carlo; yield analysis;
fLanguage
English
Journal_Title
Design & Test, IEEE
Publisher
ieee
ISSN
2168-2356
Type
jour
DOI
10.1109/MDAT.2014.2299279
Filename
6708437
Link To Document