Title :
A spline filter for multidimensional nonlinear state estimation
Author :
He, Xiaofan ; Balaji, Bhashyam ; Tharmarasa, Ratnasingham ; Kocherry, Donna Lynn ; Kirubarajan, Thiagalingam
Author_Institution :
Dept. of ECE, McMaster Univ., Hamilton, ON, Canada
Abstract :
The problem of nonlinear/non-Gaussian filtering has generated significant interest in the literature. Sequential Monte Carlo (SMC)/Markov Chain Monte Carlo (MCMC) approaches are the most commonly used. The success of nonlinear/non-Gaussian filtering depends on the accurate representation of the pdf of the system state as well as the likelihood function. However, the commonly used Monte Carlo approaches only provide weighted samples at discrete points in the state space. In this paper, a comprehensive solution for nonlinear non-Gaussian state estimation that can provide a continuous estimate of the pdf of the system state is developed based on B-splines. This method is capable of modeling any arbitrary pdf of the system state. In addition, the developed B-spline filter is able to provide statistically the same estimation accuracy as the particle filter and without suffering from the degeneracy alike problem due to its continuous nature. Further, the spline filter is also able to handle systems with multiple models, which are justified through simulations.
Keywords :
Markov processes; Monte Carlo methods; nonlinear filters; particle filtering (numerical methods); splines (mathematics); state estimation; B-spline filter; Markov chain Monte Carlo; arbitrary pdf; discrete points; likelihood function; multidimensional nonlinear state estimation; nonGaussian filtering; nonGaussian state estimation; nonlinear filtering; particle filter; sequential Monte Carlo; state space; Bayesian methods; Equations; Mathematical model; Predictive models; Probability density function; Spline; Tensile stress; B-spline; Bayesian filtering; Nonlinear filtering; tensor product;
Conference_Titel :
Information Fusion (FUSION), 2011 Proceedings of the 14th International Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4577-0267-9