Title :
Target classification using knowledge-based probabilistic model
Author :
Tang, Wenyin ; Mao, K.Z. ; Mak, Lee Onn ; Ng, Gee Wah ; Sun, Zhaoyang ; Ang, Ji Hua ; Lim, Godfrey
Author_Institution :
Sch. of EEE, Nanyang Technol. Univ., Singapore, Singapore
Abstract :
In past decades, pattern classification has been intensively explored in machine learning. With the in-depth exploration of machine learning in various applications, new challenges arise, which requests researchers to move from data-driven to domain-driven models by integrating domain knowledge, and to move from static to dynamic models to adapt to the changing environment. This paper proposes an intelligent classification system with following features, to address these requests. Firstly, this system integrates both data association and classification modules. The contextual information extracted from input data is saved as learnt knowledge which is then combined with given expert knowledge in classification. The experimental study shows that this learning process helps to reduce the ambiguity of classification. Secondly, the proposed classifier, i.e. knowledge-based naive Bayes, classifies the incoming data based on both expert knowledge and learnt knowledge. Thirdly, a soft-decision mechanism is adopted in classification algorithm, which can effectively handle overlapping data.
Keywords :
Bayes methods; image classification; learning (artificial intelligence); sensor fusion; classification algorithm; contextual information; data association modules; data classification modules; data-driven models; domain-driven models; dynamic models; expert knowledge; knowledge-based naive Bayes; knowledge-based probabilistic model; learnt knowledge; machine learning; pattern classification; soft-decision mechanism; static models; target classification; Estimation; Knowledge based systems; Libraries; Machine learning; Niobium; Production; Training data; data association; soft decision; target classification;
Conference_Titel :
Information Fusion (FUSION), 2011 Proceedings of the 14th International Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4577-0267-9