Guest Editorial

Author

Jones, G.R. ; Lipe, Thomas ; Landim, Regis ; Di Lillo, L.

Author_Institution

National Institute of Standards and Technology, Fundamental Electrical Measurements Group, Gaithersburg, MD, USA

Volume

62

Issue

6

fYear

2013

fDate

Jun-13

Firstpage

1397

Lastpage

1399

Abstract

The 2012 CPEM was held at Gaylord National Resort at National Harbor just outside of Washington, D.C., from 1-6 July 2012. Experts working in the field of metrology and its applications gathered to present and discuss the concerns and recent advances in areas of metrology and their applications to real-world situations. The authors of the 368 presentations (about 55% in poster sessions) given at the meeting were invited to submit an extended paper for publication in the CPEM 2012 issue of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. The paper submission process took place from June 18th to July 3rd, 2012. All papers were submitted electronically using the Allen- Track System, Allen Press Publishing, Lawrence, KS, as for the last conference. Approximately 120 extended papers were submitted and subjected to peer reviews by two or three experts in the field. The reviewers were asked to evaluate the papers, considering their technical and scientific originality, comprehensibility, and so on. In the end, 75 papers were accepted for publication.

Keywords

Electromagnetic measurements; Meetings; Special issues and sections;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2013.2256492

Filename

6515002