Title : 
III–V CMOS: What have we learned from HEMTs?
         
        
            Author : 
del Alamo, Jesús A. ; Kim, Dae-Hyun ; Kim, Tae-Woo ; Jin, Donghyun ; Antoniadis, Dimitri A.
         
        
        
        
        
        
            Abstract : 
The ability of Si CMOS to continue to scale down transistor size while delivering enhanced logic performance has recently come into question. An end to Moore´s Law threatens to bring to a halt the microelectronics revolution: a historical 50 year run of exponential progress in the power of electronics that has profoundly transformed human society. The outstanding transport properties of certain III-V compound semiconductors make these materials attractive to address this problem. This paper outlines the case for III-V CMOS, harvests lessons from recent research on III-V High Electron Mobility Transistors (HEMTs) and summarizes some of the key challenges in front of a future III-V logic technology.
         
        
            Keywords : 
CMOS integrated circuits; III-V semiconductors; high electron mobility transistors; HEMT; III-V CMOS; high electron mobility transistors; transport properties; CMOS integrated circuits; HEMTs; Logic gates; MODFETs; Silicon;
         
        
        
        
            Conference_Titel : 
Compound Semiconductor Week (CSW/IPRM), 2011 and 23rd International Conference on Indium Phosphide and Related Materials
         
        
            Conference_Location : 
Berlin
         
        
            Print_ISBN : 
978-1-4577-1753-6
         
        
            Electronic_ISBN : 
978-3-8007-3356-9