Title :
Performance and reliability investigations of waveguide-integrated photodetectors
Author :
Kroh, Marcel ; Beling, Andreas ; Trommer, Dirk ; Margraf, Michael ; Unterbörsch, Günter
Author_Institution :
U2T Photonics AG, Berlin, Germany
Abstract :
The reliability of 50 GHz waveguide-integrated photodetectors is studied under accelerated aging in standard high temperature tests and in additional reliability tests applying high optical input power onto the photodetectors. Based on the experimental data we determined lifetimes exceeding the requirements of telecom operators. No measureable performance degradation was found after 2000 hours high-temperature high-power stress conditions.
Keywords :
ageing; integrated optics; optical communication equipment; optical waveguides; photodetectors; reliability; aging; high-temperature high-power stress conditions; high-temperature testing; reliability; telecom operators; waveguide-integrated photodetectors; Dark current; Optical pulses; Optical saturation; Optical waveguides; Photodetectors; Reliability; Temperature measurement;
Conference_Titel :
Compound Semiconductor Week (CSW/IPRM), 2011 and 23rd International Conference on Indium Phosphide and Related Materials
Conference_Location :
Berlin
Print_ISBN :
978-1-4577-1753-6
Electronic_ISBN :
978-3-8007-3356-9
