DocumentCode :
549487
Title :
Modeling adaptive streaming applications with Parameterized Polyhedral Process Networks
Author :
Zhai, Jiali Teddy ; Nikolov, Hristo ; Stefanov, Todor
Author_Institution :
Leiden Inst. of Adv. Comput. Sci., Leiden Univ., Leiden, Netherlands
fYear :
2011
fDate :
5-9 June 2011
Firstpage :
116
Lastpage :
121
Abstract :
The Kahn Process Network (KPN) model is a widely used model-of-computation to specify and map streaming applications onto multiprocessor systems-on-chips. In general, KPNs are difficult to analyze at design-time. Thus a special case of the KPN model, called Polyhedral Process Networks (PPN), has been proposed to address the analyzability issue. However, the PPN model is not able to capture adaptive/dynamic behavior. Such behavior is usually expressed by using parameters which values are reconfigured at run-time. To model the adaptive/dynamic applications, in this paper we introduce an extension of the PPN model, called Parameterized Polyhedral Process Networks (P3N), which still provides design-time analyzability to some extent. We first formally define the P3N model and its operational semantics. In addition, we devise a design-time analysis to extract relations between parameters. Based on the analysis, we propose an approach to ensure that consistent execution of the P3N model is preserved at run-time. Using an FPGA-based MPSoC platform, we present a performance evaluation of the possible overhead caused by the run-time reconfiguration.
Keywords :
field programmable gate arrays; integrated circuit design; multiprocessing systems; system-on-chip; FPGA-based MPSoC platform; Kahn process network model; P3N model; PPN; adaptive streaming; design-time analysis; design-time analyzability; map streaming; model-of-computation; multiprocessor systems-on-chip designs; parameterized polyhedral process networks; run-time reconfiguration; Adaptation models; Analytical models; Computational modeling; Electronics packaging; IP networks; Process control; Semantics; Model of computation; adaptive embedded systems; verification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (DAC), 2011 48th ACM/EDAC/IEEE
Conference_Location :
New York, NY
ISSN :
0738-100x
Print_ISBN :
978-1-4503-0636-2
Type :
conf
Filename :
5981707
Link To Document :
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