DocumentCode :
549586
Title :
Information flow isolation in I2C and USB
Author :
Oberg, Jason ; Hu, Wei ; Irturk, Ali ; Tiwari, Mohit ; Sherwood, Timothy ; Kastner, Ryan
Author_Institution :
Comput. Sci. & Eng., UC San Diego, San Diego, CA, USA
fYear :
2011
fDate :
5-9 June 2011
Firstpage :
254
Lastpage :
259
Abstract :
Flight control, banking, medical, and other high assurance systems have a strict requirement on correct operation. Fundamental to this is the enforcement of non-interference where particular subsystems should not affect one another. In an effort to help guarantee this policy, recent work has emerged with tracking information flows at the hardware level. This article uses a specific method known as gate-level information flow tracking (GLIFT) to provide a methodology for testing information flows in two common bus protocols, I2C and USB. We show that the protocols do elicit unintended information flows and provide a solution based on time division multiple access (TDMA) that provably isolates devices on the bus from these flows. This paper also discusses the overheads in area and simulation time incurred by this TDMA based solution.
Keywords :
peripheral interfaces; time division multiple access; GLIFT; I2C bus protocols; TDMA; USB bus protocols; gate-level information flow tracking; high assurance systems; information flow isolation; noninterference enforcement; time division multiple access; Hardware; Logic gates; Protocols; Testing; Time division multiple access; Timing; Universal Serial Bus; High-assurance Systems; Information Flow Tracking; Timing Channels;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (DAC), 2011 48th ACM/EDAC/IEEE
Conference_Location :
New York, NY
ISSN :
0738-100x
Print_ISBN :
978-1-4503-0636-2
Type :
conf
Filename :
5981942
Link To Document :
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