Title :
Resistive switching AlOx-based memory with CNT electrode for ultra-low switching current and high density memory application
Author :
Wu, Yi ; Chai, Yang ; Chen, Hong-Yu ; Yu, Shimeng ; Wong, H. S Philip
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
Abstract :
We report the first AlOx-based resistive switching memory (RRAM) using carbon nanotubes (CNT) as contact electrodes. CNTs with average diameter of 1.2nm effectively localize the conduction filaments (CFs). The Al/AlOx/CNT device successfully switches over 104 cycles with less than 5μA programming current. Extreme scaling of the device down to 6nm×6nm is realized by the CNT/AlOx/CNT cross-point structure and 104 switching cycles are achieved. This work is the first step toward RRAM with nm-scale electrodes. It paves the way for future high density, low power non-volatile RRAM memory application.
Keywords :
aluminium compounds; carbon nanotubes; low-power electronics; random-access storage; Al-AlOx; CNT electrode; carbon nanotubes; conduction filaments; contact electrodes; cross-point structure; high density memory application; low power nonvolatile RRAM memory application; nm-scale electrodes; resistive switching memory; size 1.2 nm; ultra-low switching current; Copper; Current measurement; Electrodes; Programming; Resistance; Switches;
Conference_Titel :
VLSI Technology (VLSIT), 2011 Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-9949-6