DocumentCode
549717
Title
A 1.4µA reset current phase change memory cell with integrated carbon nanotube electrodes for cross-point memory application
Author
Liang, Jiale ; Jeyasingh, Rakesh Gnana David ; Chen, Hong-Yu ; Wong, H. -S Philip
Author_Institution
Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
fYear
2011
fDate
14-16 June 2011
Firstpage
100
Lastpage
101
Abstract
A cross-point phase change memory (PCM) cell working close to its ultimate scaling limit is demonstrated for the first time with an ultra low reset current of 1.4μA and set current of 0.5μA. This is the lowest value ever reported. Carbon nanotubes (CNTs) are utilized as the bottom electrode of the cell, which bring the lithography-independent critical dimension down to 1.2 nm. Good electrical characteristics obtained demonstrate the functionality and potential viability of PCM for highly scaled ultra-dense memory at 2.5 nm node.
Keywords
carbon nanotubes; lithography; phase change memories; CNT; cell electrode; cross-point PCM cell; cross-point memory application; current 0.5 muA; current 1.4 muA; electrical characteristics; highly-scaled ultradense memory; integrated carbon nanotube electrodes; lithography-independent critical dimension; phase change memory cell; potential viability; size 1.2 nm; size 2.5 nm; ultralow-reset current; Aluminum oxide; Electrodes; Phase change materials; Random access memory; Resistance; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology (VLSIT), 2011 Symposium on
Conference_Location
Honolulu, HI
ISSN
0743-1562
Print_ISBN
978-1-4244-9949-6
Type
conf
Filename
5984659
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