• DocumentCode
    549717
  • Title

    A 1.4µA reset current phase change memory cell with integrated carbon nanotube electrodes for cross-point memory application

  • Author

    Liang, Jiale ; Jeyasingh, Rakesh Gnana David ; Chen, Hong-Yu ; Wong, H. -S Philip

  • Author_Institution
    Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
  • fYear
    2011
  • fDate
    14-16 June 2011
  • Firstpage
    100
  • Lastpage
    101
  • Abstract
    A cross-point phase change memory (PCM) cell working close to its ultimate scaling limit is demonstrated for the first time with an ultra low reset current of 1.4μA and set current of 0.5μA. This is the lowest value ever reported. Carbon nanotubes (CNTs) are utilized as the bottom electrode of the cell, which bring the lithography-independent critical dimension down to 1.2 nm. Good electrical characteristics obtained demonstrate the functionality and potential viability of PCM for highly scaled ultra-dense memory at 2.5 nm node.
  • Keywords
    carbon nanotubes; lithography; phase change memories; CNT; cell electrode; cross-point PCM cell; cross-point memory application; current 0.5 muA; current 1.4 muA; electrical characteristics; highly-scaled ultradense memory; integrated carbon nanotube electrodes; lithography-independent critical dimension; phase change memory cell; potential viability; size 1.2 nm; size 2.5 nm; ultralow-reset current; Aluminum oxide; Electrodes; Phase change materials; Random access memory; Resistance; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology (VLSIT), 2011 Symposium on
  • Conference_Location
    Honolulu, HI
  • ISSN
    0743-1562
  • Print_ISBN
    978-1-4244-9949-6
  • Type

    conf

  • Filename
    5984659