• DocumentCode
    549727
  • Title

    Comparison of performance, switching energy and process variations for the TFET and MOSFET in logic

  • Author

    Avci, Uygar E. ; Rios, Rafael ; Kuhn, Kelin ; Young, Ian A.

  • Author_Institution
    Technol. & Manuf. Group, Intel Corp., Hillsboro, OR, USA
  • fYear
    2011
  • fDate
    14-16 June 2011
  • Firstpage
    124
  • Lastpage
    125
  • Abstract
    A detailed circuit assessment of Tunneling Field Effect Transistors (TFET) versus MOSFET operating near device threshold supply voltage, including the consideration of process variations, is reported. The analysis incorporates simulated 20 nm TFET and MOSFET device characteristics combined with detailed circuit simulation. For very low power logic applications requiring near device threshold supply voltage, the results show that TFET logic can operate at equal standby power and switching energy to MOSFET, but with a ~8x performance advantage. The study also shows that device parameter variation is not a significant factor for differentiation between MOSFET and TFET.
  • Keywords
    MOSFET; logic circuits; tunnelling; MOSFET; TFET logic; circuit simulation; logic applications; switching energy; threshold supply voltage; tunneling field effect transistors; CMOS integrated circuits; Delay; Logic gates; Performance evaluation; Power MOSFET; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology (VLSIT), 2011 Symposium on
  • Conference_Location
    Honolulu, HI
  • ISSN
    0743-1562
  • Print_ISBN
    978-1-4244-9949-6
  • Type

    conf

  • Filename
    5984671