DocumentCode :
549841
Title :
A 512Mb phase-change memory (PCM) in 90nm CMOS achieving 2b/cell
Author :
Close, G.F. ; Frey, U. ; Morrish, J. ; Jordan, R. ; Lewis, S. ; Maffitt, T. ; Breitwisch, M. ; Hagleitner, C. ; Lam, C. ; Eleftheriou, E.
Author_Institution :
IBM Res. - Zurich, Zurich, Switzerland
fYear :
2011
fDate :
15-17 June 2011
Firstpage :
202
Lastpage :
203
Abstract :
We present a fully integrated phase-change memory chip serving both as a 2b/cell technology demonstrator and benchmarking platform for higher density multi-level cell (MLC). The 256M-cell memory achieves 2b/cell at a raw BER ~ 2 10-4. For exploring the 2+b/cell regime, the peripheral readout and programming circuitry supports MLC up to 4b/cell. The iterative programming of the MLC cells is optimized by choosing from different modes (e.g., current vs. voltage controlled write pulse) and fine-tuning the programmable parameters. The 6b readout ADC offers high-throughput (690Mb/s) characterization of PCM arrays directly on-chip, thereby allowing studies of drift and noise.
Keywords :
CMOS integrated circuits; error statistics; phase change memories; 2b/cell technology; ADC; BER; CMOS; MLC; PCM; bit rate 690 Mbit/s; iterative programming; memory size 512 MByte; multilevel cell; peripheral readout; phase-change memory chip; programming circuitry; size 90 nm; Noise; Phase change materials; Programming; Resistance; Tiles; Very large scale integration; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits (VLSIC), 2011 Symposium on
Conference_Location :
Honolulu, HI
ISSN :
2158-5601
Print_ISBN :
978-1-61284-175-5
Type :
conf
Filename :
5986105
Link To Document :
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