DocumentCode :
549863
Title :
A 640×480 image sensor with unified pixel architecture for 2D/3D imaging in 0.11µm CMOS
Author :
Kim, Seong-Jin ; Kim, James D K ; Han, Sang-Wook ; Kang, Byongmin ; Lee, Keechang ; Kim, Chang-Yeong
Author_Institution :
Samsung Adv. Inst. of Technol., South Korea
fYear :
2011
fDate :
15-17 June 2011
Firstpage :
92
Lastpage :
93
Abstract :
A 3D image sensor is presented employing a time multiplexed concept for color and depth image acquisition in a single chip to generate a real-time 3D image of an arbitrary scene. The pixel adopts a split photodiode to demodulate time-of-flight signals effectively. Every four pixels share two storages and readout transistors to utilize 100% of photons and increase the sensitivity of infrared light by simple binning operation at the expense of resolution. With the fabricated prototype sensor, 640×480 color and depth images of the scenes 1-3m away are captured with an accuracy of 1-6cm.
Keywords :
CMOS image sensors; demodulation; image colour analysis; 2D/3D imaging; 3D image sensor; CMOS technology; color image acquisition; depth image acquisition; readout transistors; size 0.11 mum; split photodiode; time multiplexed concept; time-of-flight signal demodulation; unified pixel architecture; Accuracy; Color; Image color analysis; Imaging; Logic gates; Three dimensional displays; Time frequency analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits (VLSIC), 2011 Symposium on
Conference_Location :
Honolulu, HI
ISSN :
2158-5601
Print_ISBN :
978-1-61284-175-5
Type :
conf
Filename :
5986400
Link To Document :
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