Title :
Reliability analysis of a reparable multistate device attended by a repairman with single vacation
Author :
Ma Lixia ; Xu Genqi
Author_Institution :
Dept. of Math., Tianjin Univ., Tianjin, China
Abstract :
A reparable multistate device attended by a repairman with single vacations is discussed in this paper. It is assumed that the life of the operating unit and the vacation time of the repairman were both exponential distributions, while the repair time of the unit has a general continuous distribution. By using the C0-semigroup theory and analyzing the spectra distribution of the system operator, the unique existence of the solution, the non-negative steady-state solution and the exponential stability of the system are derived. Based on this, some reliability indices of the system are presented at the end of the paper.
Keywords :
asymptotic stability; exponential distribution; group theory; reliability theory; C0 semigroup theory; continuous distribution; exponential distribution; exponential stability; reliability analysis; repairman-with-single vacation; reparable multistate device; Asymptotic stability; Eigenvalues and eigenfunctions; Equations; Maintenance engineering; Stability analysis; Steady-state; Asymptotic Stability; Availability; C0 Semigroup; Exponential Stability; Linear operator; Steady-state Reliability;
Conference_Titel :
Control Conference (CCC), 2011 30th Chinese
Conference_Location :
Yantai
Print_ISBN :
978-1-4577-0677-6
Electronic_ISBN :
1934-1768
