DocumentCode :
550942
Title :
A survey of run-to-run control algorithms for high-mix semiconductor manufacturing processes
Author :
Ma Ming-Da ; Zeng Xian-Lin ; Duan Guang-Ren
Author_Institution :
Center for Control & Guidance Technol., Harbin Inst. of Technol., Harbin, China
fYear :
2011
fDate :
22-24 July 2011
Firstpage :
5474
Lastpage :
5479
Abstract :
The modeling and control of high-mix production system in semiconductor manufacturing impose great challenge for process engineers. Many different methods have been proposed to improve control performance of the high-mix system. In this paper, an overview of the recent control algorithms for high-mix system is presented. The thread-based methods and the non-threaded state estimation methods which are studied and practiced widely in semiconductor manufacturing are discussed in detail. Further research directions for the run-to-run control of mixed product system are pointed out based on the extensive study of current literatures.
Keywords :
manufacturing processes; semiconductor industry; state estimation; high-mix production system; high-mix semiconductor manufacturing process; mixed product system; nonthreaded state estimation method; run-to-run control algorithm; thread-based method; Context; Manufacturing processes; Process control; Semiconductor device modeling; State estimation; Control Threads; High-mix process; Run-to-run control; Semiconductor Manufacturing; State Estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control Conference (CCC), 2011 30th Chinese
Conference_Location :
Yantai
ISSN :
1934-1768
Print_ISBN :
978-1-4577-0677-6
Electronic_ISBN :
1934-1768
Type :
conf
Filename :
6001282
Link To Document :
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