• DocumentCode
    551312
  • Title

    Structural analysis of nanometer-size pyramid grown on an end of tungsten blunt tip

  • Author

    Nakagawa, Tatsuhiro ; Rokuta, E. ; Hashimoto, G. ; Murata, H. ; Shimoyama, H. ; Oshima, C.

  • Author_Institution
    Fac. of Sci. & Eng., Meijo Univ. Nagoya, Nagoya, Japan
  • fYear
    2011
  • fDate
    18-22 July 2011
  • Firstpage
    51
  • Lastpage
    52
  • Abstract
    We have fabricated nanometer-size pyramids (nanopyramids) on blunt W tips to apply for bright field emitter. The blunt tips were preliminarily given remolding treatment in order to sharpen their ends. The nanopyramids were grown on the tip end by being covered with thin layers of Pd and subsequently annealed at 1000 K. The structures of the specimen were analyzed by using filed ion microscopy (FIM). As a result, we have clarified detailed information about the atomic structures, of which the acquisition was not allowed in case that only FEM was employed. As far as the remolded W tips were concerned, the tip-end dimension of about 3 nm was narrowest possible for all the combinations of the remolding temperature and electric field. On the other hand, the grown nanopyramid with {211} sides and monoatomic-chain ridges exhibited even narrower summit. These findings are consistent with the contrasting behaviors of current stability data previously clarified by the FEM study.
  • Keywords
    electric fields; field ion emission; nanoelectronics; tungsten; atomic structure; bright field emitter; electric field; filed ion microscopy; monoatomic-chain ridge; nanometer-size pyramid; nanopyramids; remolding treatment; structural analysis; tip-end dimension; tungsten blunt tip; Annealing; Atomic layer deposition; Electric fields; Finite element methods; Heating; Iron; Stability analysis; FIM; remolding treatment; single-atom emitter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference (IVNC), 2011 24th International
  • Conference_Location
    Wuppertal
  • ISSN
    pending
  • Print_ISBN
    978-1-4577-1243-2
  • Electronic_ISBN
    pending
  • Type

    conf

  • Filename
    6004557