Title :
A Wide-Range PLL Using Self-Healing Prescaler/VCO in 65-nm CMOS
Author :
I-Ting Lee ; Yun-Ta Tsai ; Shen-Iuan Liu
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
The variability and leakage current in nanoscale CMOS technology may degrade the circuit performances significantly. To accommodate the above issues in a wide-range phase-locked loop (PLL), a self-healing prescaler, a self-healing voltage-controlled oscillator (VCO), and a calibrated charge pump (CP) are presented. This PLL is fabricated in a 65-nm CMOS technology and its active area is 0.0182 mm2 . For the self-healing VCO, its measured frequency range is from 60 to 1489 MHz. When this PLL operates at 855 MHz, the measured rms and peak-to-peak jitters are 8.03 and 55.6 ps, respectively. The measured reference spur is -52.89 dBc. This PLL consumes 4.3 mW from 1.2 V supply without buffers.
Keywords :
CMOS analogue integrated circuits; UHF integrated circuits; UHF oscillators; charge pump circuits; phase locked loops; voltage-controlled oscillators; calibrated charge pump; frequency 60 MHz to 1489 MHz; nanoscale CMOS technology; peak-to-peak jitters; power 4.3 mW; self-healing prescaler; self-healing prescaler-VCO; self-healing voltage-controlled oscillator; size 65 nm; voltage 1.2 V; wide-range PLL; wide-range phase-locked loop; Current measurement; Detectors; Leakage current; Logic gates; Phase locked loops; Transistors; Voltage-controlled oscillators; Leakage current; nanoscale CMOS technology; phased-locked loop (PLL);
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2012.2186990