DocumentCode
551822
Title
New method to measure the surface deformation of optics irradiated by high-power laser and new way to stimulate its influence on beam quality
Author
Liu, Haiyong ; Zhang, Zhizhong ; Zhang, Xiaowei ; An, Zhenjie ; Tan, Xiaohu ; Chen, Risheng ; Haiyong Liu
Author_Institution
Tianjin Inst. of Phys. & Chem. Eng., Tianjin, China
Volume
2
fYear
2011
fDate
29-31 July 2011
Abstract
A new method was proposed to measure the surface deformation, where the optics is irradiated by a high power laser when they are measured with ZYGO interferometer. The fiber with output shaper was used to transmit the laser. With this simple and convenient method, measuring k9, fused silica and antireflection coated silica windows, where a power of 200W doubled YAG laser was used. Also a new way was proposed to simulate the influence of the deformation on beam quality with the way of substituting normalized Zernike polynomial coefficients of all optics measured by former method into Zemax software. The results preferably reveal the beam transmission distortion by thermal deformation of optics on true application conditions.
Keywords
Zernike polynomials; antireflection coatings; deformation; laser beam effects; light interferometry; measurement by laser beam; optical engineering computing; optical variables measurement; silicon compounds; solid lasers; surface topography measurement; SiO2; YAG; YAG laser; ZYGO interferometer; Zemax software; Zernike polynomial coefficients; antireflection coated silica windows; beam transmission distortion; fused silica; high-power laser irradiated surface; laser beam quality; power 200 W; surface deformation measurement; thermal deformation; Glass; Heating; Laser beams; Laser theory; Power lasers; Silicon compounds; Solids; Zygo interferometer; beam quality; thermal distortion; zernike polynomial;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics and Optoelectronics (ICEOE), 2011 International Conference on
Conference_Location
Dalian
Print_ISBN
978-1-61284-275-2
Type
conf
DOI
10.1109/ICEOE.2011.6013276
Filename
6013276
Link To Document