Title :
Investigation of the effect of the ESD to the transient voltage suppressor
Author :
Wang, Zhenxing ; Wu, Zhancheng ; Zhang, Xijun ; Cao, Yanbin
Author_Institution :
Electrostatic & Electromagn. Protection Res. Inst., Shijiazhuang Mech. Eng. Collage, Shijiazhuang, China
Abstract :
The transient voltage suppressor (TVS) is commonly used in circuit in order to protect the circuit from the Electrostatic Discharge (ESD). In this paper, the turn on voltage and the clamping voltage of the TVS device is tested to figure the capability of the device. The test shows the clamping voltage increase as the test voltage increase. After injected the BMM pulses, the internal of device was damaged. Both the turn on voltage and the clamping voltage of the TVS device would increase, and the protect capability of the TVS device decreased.
Keywords :
electrostatic discharge; surge protection; transients; ESD; clamping voltage; electrostatic discharge; transient voltage suppressor; turn on voltage; CMOS integrated circuits; Electrostatic discharge; Generators; Junctions; Reliability; BMM; ESD; TLP; TVS;
Conference_Titel :
Electronics and Optoelectronics (ICEOE), 2011 International Conference on
Conference_Location :
Dalian
Print_ISBN :
978-1-61284-275-2
DOI :
10.1109/ICEOE.2011.6013319
