• DocumentCode
    552058
  • Title

    Frequency response of amorphous silicon photoconductors

  • Author

    Otosaka, Hideyuki ; Ebuchi, Shingo ; Maruyama, Takeo ; Iiyama, Koichi ; Ohdaira, Keisuke ; Matsumura, Hideki

  • Author_Institution
    Kanazawa Univ., Ishikawa, Japan
  • fYear
    2011
  • fDate
    4-8 July 2011
  • Firstpage
    295
  • Lastpage
    296
  • Abstract
    We fabricated an amorphous silicon photoconductor and measured a sensitivity and frequency response at a wavelength of 650 nm. The maximum sensitivity of 4.6m A/W and the maximum bandwidth of 10 MHz were obtained at the bias voltage of 10 V.
  • Keywords
    amorphous semiconductors; elemental semiconductors; frequency response; integrated optics; optical fabrication; photoconducting materials; photodetectors; silicon; Si; amorphous silicon photoconductors; bias voltage; frequency response; sensitivity measurement; voltage 10 V; wavelength 650 nm; Bandwidth; Frequency measurement; Frequency response; Photoconducting materials; Photoconductivity; Sensitivity; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Opto-Electronics and Communications Conference (OECC), 2011 16th
  • Conference_Location
    Kaohsiung
  • Print_ISBN
    978-1-61284-288-2
  • Electronic_ISBN
    978-986-02-8974-9
  • Type

    conf

  • Filename
    6015131