An analogue electronic circuits specification driven testing with the use of time domain response´s features

This paper presents a deterministic method of analogue electronic circuits´ specification driven testing. This method is based on an analysis of a circuit-under-test time-domain response´s to a pulse excitation. We are extracting the response´s and its first order derivative minima and maxima locations. Then, the tested circuit´s specifications are mapped into response´s features planes. At the test stage, extracted response´s features are used to predict specifications values. The decision about the test result (GO/NO-GO) is made with a simple deterministic inference system. Our testing method has been verified with a use of an exemplary circuit, a low-pass filter.