Title :
Fault diagnosis of analog electronic circuits with tolerances in mind
Author :
Chruszczyk, Lukasz
Author_Institution :
Fac. of Autom. Control, Electron. & Comp. Sci., Silesian Univ. of Technol., Gliwice, Poland
Abstract :
This paper presents analysis of components tolerance influence on fault diagnosis efficiency of analog electronic circuits. There has been proposed method of finding optimal frequency of input periodic excitation with simultaneous maximization of components tolerances in order to keep assumed level of diagnosis efficiency. There has been also proposed departure from classical “location after detection” schema. Combination of detection and location in a single step can remarkably shorten diagnosis time. The optimization process involves genetic algorithm.
Keywords :
analogue integrated circuits; design for testability; fault diagnosis; genetic algorithms; analog electronic circuits; components tolerance; design for testability; fault diagnosis; genetic algorithm; maximization; optimal frequency; optimization; periodic excitation; Circuit faults; Encoding; Fault detection; Fault location; Genetic algorithms; IP networks; analog circuit; catastrophic fault; component tolerance; fault detection; fault diagnosis; fault location; genetic algorithm; single fault; test time reduction;
Conference_Titel :
Mixed Design of Integrated Circuits and Systems (MIXDES), 2011 Proceedings of the 18th International Conference
Conference_Location :
Gliwice
Print_ISBN :
978-1-4577-0304-1