DocumentCode :
55236
Title :
Probabilistic Analysis of a Generalized Perturb and Observe Algorithm Featuring Robust Operation in the Presence of Power Curve Traps
Author :
Jones, David C. ; Erickson, Robert W.
Author_Institution :
Phobos Energy, Inc., Menlo Park, CA, USA
Volume :
28
Issue :
6
fYear :
2013
fDate :
Jun-13
Firstpage :
2912
Lastpage :
2926
Abstract :
Local maxima in the measured power curve of a photovoltaic (PV) panel, called traps, are caused by switching transients and other deterministic phenomena in PV power converters. Traps exist even in the absence of shading, and degrade the performance of perturb and observe (PO) maximum power point trackers. A generalized PO (GPO) algorithm is proposed which eliminates this degradation. PO/GPO algorithms in the presence of random noise are shown to be modeled by multidimensional Markov chains. These models quantify the tendency for PO at low random noise levels to become stuck in traps following insolation changes, thereby decreasing tracking performance and reducing harvested power. By contrast, GPO tracks insolation changes unhindered by traps. All theoretical results are experimentally verified using a hardware PV converter.
Keywords :
Markov processes; energy harvesting; maximum power point trackers; photovoltaic power systems; power measurement; probability; random noise; switching convertors; switching transients; PO-GPO algorithm; PV panel; PV power converter; deterministic phenomena; generalized perturb and observe maximum power point tracker; local maxima; multidimensional Markov chain modelling; photovoltaic panel; power curve measurement; power curve trap presence; power harvesting reduction; probabilistic analysis; random noise; switching transient; Algorithm design and analysis; Markov processes; Noise; Power measurement; Switches; Transient analysis; Voltage measurement; Markov chains; maximum power point tracking (MPPT); perturb and observe (PO); photovoltaic (PV) power electronics;
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2012.2224378
Filename :
6329443
Link To Document :
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