Mathematical Modeling and Analysis of a Very Low Frequency HV Test System

This paper presents a new type of very low frequency (VLF) high-voltage test system for on-site cable tests up to 200 kV rms. The VLF system is based on a so called differential resonance technology (DRT), which enables a light-weight and compact construction of cable test systems. A mathematical model of the test system is presented, which is used for a detailed analysis and optimization of the DRT system. Measurement results on a prototype for 200 kV rms and loads up to 0.75 μF are used to validate the mathematical model and to show the feasibility of the test system.