DocumentCode :
553634
Title :
Power cycling test bench for IGBT power modules used in wind applications
Author :
Wagenitz, Dennis ; Westerholz, A. ; Erdmann, Eike ; Hambrecht, A. ; Dieckerhoff, Sibylle
Author_Institution :
Beuth Univ. of Appl. Sci., Berlin, Germany
fYear :
2011
fDate :
Aug. 30 2011-Sept. 1 2011
Firstpage :
1
Lastpage :
10
Abstract :
A power cycling test bench is realized for the lifetime analysis of IGBT power modules and for the development of a reliability management system predicting the deterioration of the devices. The focus is on converters for doubly-fed induction generators used in wind turbines. In these applications, due to the low frequent power losses under steady state conditions and due to changing wind conditions, the thermomechanical stress on IGBT power modules is high. The presented test bench offers accelerated ageing of the power semiconductor devices under real load conditions with the phase legs operating from a 1070VDC dc-link allowing sinusoidal load currents up to 800A amplitude at frequencies from 0.1Hz to 13Hz.
Keywords :
asynchronous generators; insulated gate bipolar transistors; power convertors; power semiconductor devices; wind turbines; IGBT power modules; converters; doubly-fed induction generators; frequency 0.1 Hz to 13 Hz; lifetime analysis; phase legs; power cycling test bench; power semiconductor devices; reliability management system; thermomechanical stress; voltage 1070 V; wind turbines; Current measurement; Insulated gate bipolar transistors; Multichip modules; Pulse width modulation; Temperature measurement; Voltage control; Voltage measurement; Doubly fed induction motor; IGBT; power cycling; wind energy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics and Applications (EPE 2011), Proceedings of the 2011-14th European Conference on
Conference_Location :
Birmingham
Print_ISBN :
978-1-61284-167-0
Electronic_ISBN :
978-90-75815-15-3
Type :
conf
Filename :
6020493
Link To Document :
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