DocumentCode :
553817
Title :
Reliability of insulating substrates — High temperature power electronics for more electric aircraft
Author :
Schletz, A. ; Nomann, M. ; Rauch, Michael ; Kraft, Silke ; Egelkraut, S.
Author_Institution :
Fraunhofer Inst. for Integrated Syst. & Device Technol., Nuremberg, Germany
fYear :
2011
fDate :
Aug. 30 2011-Sept. 1 2011
Firstpage :
1
Lastpage :
7
Abstract :
Insulating substrates for high temperature power electronics are in the focus of this paper. The targets were 200°C ambient temperature (base plate) and 300°C junction temperature for the use of silicon carbide devices. DBA and DBC were tested if they are suitable to reach this target. A comparative temperature cycling test under extreme conditions was done. Standard DBC substrates with alumina ceramic withstand only a few cycles. The first idea that higher mean temperatures will increase the temperature cycling capability could not be confirmed. DBA substrates have a very high temperature cycling capability, more than one order of magnitude higher compared to standard DBC. There is a totally different failure mechanism. The surface get rough. There was no optical influence on the die attach quality.
Keywords :
III-V semiconductors; avionics; high-temperature electronics; reliability; silicon compounds; space vehicle electronics; wide band gap semiconductors; DBA substrate; DBC substrate; SiC; alumina ceramic; comparative temperature cycling test; die attach quality; electric aircraft; failure mechanism; high-temperature power electronics; insulating substrate reliability; silicon carbide devices; temperature 200 degC; temperature 300 degC; temperature cycling capability; Reliability; Rough surfaces; Substrates; Surface roughness; Temperature dependence; Temperature distribution; Temperature measurement; high temperature; insulating substrate; power electronics; reliability; silicon carbide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics and Applications (EPE 2011), Proceedings of the 2011-14th European Conference on
Conference_Location :
Birmingham
Print_ISBN :
978-1-61284-167-0
Electronic_ISBN :
978-90-75815-15-3
Type :
conf
Filename :
6020676
Link To Document :
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