DocumentCode :
553930
Title :
Reliability analysis based on significance
Author :
de B Naviner, Lirida A. ; Naviner, Jean-Francois ; Tian Ban ; Gutemberg, G.S.
Author_Institution :
CNRS, TELECOM-ParisTech, Paris, France
fYear :
2011
fDate :
11-12 Aug. 2011
Firstpage :
1
Lastpage :
7
Abstract :
Due to the expected increase of defects and errors in circuits based on deep submicron technologies, reliability has become an important design criterion. As reliability improvement is generally achieved by adding redundancy, identify and classify critical blocks of a circuit is a major concern. This work presents two new classification methods regarding the significance of a block with respect to the reliability of a circuit. One gives the criticality of each block for the circuit reliability and the other indicates which priority should be given to each block in a process of adding redundancy. Thus, the proposed methods provide key information for the designer who is looking for efficient solutions of reliability monitoring or reliability improvement.
Keywords :
circuit reliability; block criticality; classification methods; deep submicron technologies; reliability analysis; Circuit faults; Integrated circuit reliability; Logic gates; Monitoring; Sensitivity; Tunneling magnetoresistance; Eligibility; Reliability Analysis; Reliability Improvement; Reliability Monitoring; Sensitivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Argentine School of Micro-Nanoelectronics Technology and Applications (EAMTA), 2011
Conference_Location :
Buenos Aires
Print_ISBN :
978-1-4577-1236-4
Type :
conf
Filename :
6021291
Link To Document :
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