DocumentCode
554371
Title
Ageing condition inspection system for electrical contact based on micro-current contact resistance trend tracker
Author
Shi Jie
Author_Institution
China Nucl. Power Technol. Res. Inst., Suzhou Nucl. Power Instn. Co., Ltd., Suzhou, China
Volume
2
fYear
2011
fDate
12-14 Aug. 2011
Firstpage
613
Lastpage
616
Abstract
An equipment which was used to inspect the ageing condition of electrical contact by track the trend of contact resistance under micro-current was developed. Compared with existing technology, the equipment can not only measures the contact resistance under micro-current(100 μ A) which is propitious to evaluating the ageing condition of a contact, but also grasp the trend that contact resistance follows the changed current (range of 100 μ A to 1A) which is help to estimate where a contact should be used and which type of contact should be used in specific situation. The scanning electron microscopy and Energy Dispersive Analysis System of X-ray were used to verify the ageing condition.
Keywords
ageing; contact resistance; electrical contacts; inspection; X-ray condition; ageing condition inspection system; contact resistance; current 100 muA to 1 A; electrical contact; energy dispersive analysis system; microcurrent contact resistance trend tracker; scanning electron microscopy; Contact resistance; Current measurement; Electrical resistance measurement; Films; Surface morphology; Voltage measurement; ageing condition; electrical contact; energy dispersive analysis system of X-ray; micro-current contact reslstance(MCCR); scanning electron microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic and Mechanical Engineering and Information Technology (EMEIT), 2011 International Conference on
Conference_Location
Harbin, Heilongjiang, China
Print_ISBN
978-1-61284-087-1
Type
conf
DOI
10.1109/EMEIT.2011.6023176
Filename
6023176
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