• DocumentCode
    554511
  • Title

    A new method for the analysis of temperature-dependent resistances and inductances of multiconductor cable

  • Author

    Men Xiuhua ; Ma Yuzhen ; Shao Haiyan

  • Author_Institution
    Sch. of Mech. Eng., Univ. of Jinan, Jinan, China
  • Volume
    4
  • fYear
    2011
  • fDate
    12-14 Aug. 2011
  • Firstpage
    1892
  • Lastpage
    1896
  • Abstract
    The whole mechanical test procession, especially transmission cable is effected evidently by environment temperature fluctuation. So of particular interest in the paper is to discuss the resistance and inductance parameters of multiconductor at environment of changing temperature. A new approach with the given formulas is presented to calculate electric parameters using finite element method. And then, the temperature-dependent characteristics of resistance and inductance are obtained, which are agreed with the result obtained by energy method. The change of equivalent current density for multiconductor also highlights the parameters change when proximate effect is considered. The result is shown that the temperature-dependent parameters bring more important responses on the terminal of circuit network containing certain deviation. It is shown that. For the first time, results are shown for the lossy transmission cable with temperature-dependent parameters characteristic, which are used to quantify the main practical engineering.
  • Keywords
    current density; finite element analysis; multiconductor transmission lines; circuit network; electric parameters; environment temperature fluctuation; equivalent current density; finite element method; lossy transmission cable; multiconductor cable inductances analysis; multiconductor inductance parameters; multiconductor resistance parameters; practical engineering; temperature-dependent parameters; temperature-dependent resistances analysis; Conductors; Current density; Educational institutions; Inductance; Mathematical model; Power cables; Resistance; Mechanical test; Multiconductor; Parameters extraction; Temperature-demendent;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic and Mechanical Engineering and Information Technology (EMEIT), 2011 International Conference on
  • Conference_Location
    Harbin, Heilongjiang, China
  • Print_ISBN
    978-1-61284-087-1
  • Type

    conf

  • DOI
    10.1109/EMEIT.2011.6023408
  • Filename
    6023408