DocumentCode :
555051
Title :
Oscillography of transient processes at physical phase-to-ground fault modeling in operational 6-35 kV networks
Author :
Shirkovets, Andrey I. ; Vasilyeva, A.Yu. ; Telegin, Andrey V. ; Sarin, L.I. ; Ilinykh, M.V.
fYear :
2011
fDate :
7-9 July 2011
Firstpage :
1
Lastpage :
6
Abstract :
The paper presents methods of accurate determination of single phase-to-ground currents, advantages and disadvantages of these methods, and general requirements to the measuring equipment used in oscillography of transient processes at single phase-to-ground faults. These methods have been tried in operational 6-35 kV networks for 8 years. Experimental investigations allow doing research of main parameters of a zero-sequence circuit. Using recorded oscillograms, we can analyze the character of transient processes, evaluate the efficiency of the compensation system, suppose the nature of processes, and determine overvoltage levels. Based on experimental investigations and calculations, recommendations on effective internal overvoltage protection at arcing ground faults can be proposed.
Keywords :
oscillographs; overvoltage; power system faults; power system harmonics; power system simulation; power system transients; arcing ground faults; compensation system; effective internal overvoltage protection; operational networks; oscillography; overvoltage levels; physical phase-to-ground fault modeling; recorded oscillograms; single phase-to-ground currents; time 8 yr; transient process; voltage 6 kV to 35 kV; zero-sequence circuit; Circuit faults; Coils; Harmonic analysis; Insulation; Power harmonic filters; Resistance; Transient analysis; capacitance current; higher harmonics; oscillogram; oscillography; single phase-to-ground current; single phase-to-ground fault; transient process;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Energetics (IYCE), Proceedings of the 2011 3rd International Youth Conference on
Conference_Location :
Leiria
Print_ISBN :
978-1-4577-1494-8
Type :
conf
Filename :
6028318
Link To Document :
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