DocumentCode :
555861
Title :
Sine-fitting by the energy-based method in the dynamic testing of ADCs
Author :
Belega, Daniel ; Petri, Dario ; Dallet, Dominique
Author_Institution :
Fac. of Electron. & Telecommun., Politeh. Univ. of Timisoara, Timisoara, Romania
Volume :
1
fYear :
2011
fDate :
15-17 Sept. 2011
Firstpage :
33
Lastpage :
38
Abstract :
The paper proposes a sine-fit algorithm exploiting the Energy-Based Method (EBM) to estimate the sine-wave parameters. Its use in the estimation of Analog-to-Digital Converter (ADC) spectral parameters like SIgnal-to-Noise And Distortion (SINAD) ratio and Effective Number Of Bits (ENOB) is investigated. A performance comparison with some state-of-the-art ADC test methods is performed using both computer simulations and experimental results. Finally, some important results concerning the algorithm design process, such as the selection of the optimal window and the number of acquired samples, are reported.
Keywords :
analogue-digital conversion; circuit noise; circuit testing; ADC; analog-digital converter spectral parameters; dynamic testing; energy-based method; signal-to-noise-and-distortion ratio; sine-fit algorithm; sine-wave parameters; Accuracy; Algorithm design and analysis; Estimation; Heuristic algorithms; Noise; Testing; Wideband; Energy-based method; SINAD and ENOB estimation; noncoherent sampling; uncertainty analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Data Acquisition and Advanced Computing Systems (IDAACS), 2011 IEEE 6th International Conference on
Conference_Location :
Prague
Print_ISBN :
978-1-4577-1426-9
Type :
conf
DOI :
10.1109/IDAACS.2011.6072706
Filename :
6072706
Link To Document :
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