Title :
Time-domain modelling of active electrically fine features in TLM
Author :
Scott, I. ; Kumar, V. ; Greedy, S. ; Thomas, D.W.P. ; Christopoulos, C. ; Sewell, P.
Author_Institution :
George Green Inst. for Electromagn. Res., Univ. of Nottingham, Nottingham, UK
Abstract :
The use of field solvers to simulate ICs is advantageous due to the decreasing size of modern electronic components where field effects are a necessary part of the model. Unfortunately, the simulation of complex ICs using only field solvers is computationally expensive due to the fine spatial sampling required. In this paper we will derive an interface to embed a behavioural model of a complex IC directly into a full-wave field simulation, gaining the generality and simplicity of the behavioural model, while maintaining an acceptable spatial sampling in the field model to minimize the overall computational runtime and allow full simulation of the electromagnetic environment within which the component is placed.
Keywords :
electromagnetic waves; integrated circuit modelling; transmission line matrix methods; IC simulation; TLM; active electrically fine features; electromagnetic environment; electronic components; field solvers; full-wave field simulation; time-domain modelling; Computational modeling; Electromagnetic compatibility; Integrated circuit modeling; Time domain analysis; Time varying systems; Transmission lines; IBIS; TLM; behavioural models;
Conference_Titel :
EMC Europe 2011 York
Conference_Location :
York
Print_ISBN :
978-1-4577-1709-3