Title :
Switch based non-linear models for system level 3-D ESD simulation
Author :
Turunen, Jouko ; Tarvainen, Timo ; Hekkala, Aki ; Ihme, Sami ; Reinvuo, Tuomas ; Tamminen, Pasi
Author_Institution :
Esju Oy, Oulu, Finland
Abstract :
ESD sensitivity of components at the system level is one of the key EMC risks in hand held devices. It is often very difficult to estimate what are the causes and effects from the pass or fail type results of the system level ESD tests. Therefore, simulations are necessary. However, non-linear simulation models of materials are lacking. This paper proposes a measurement method and a related non-linear model for material ESD characterization in 3-D electromagnetic simulations.
Keywords :
electrostatic discharge; sensitivity analysis; 3D electromagnetic simulations; ESD sensitivity; handheld devices; material ESD characterization; measurement method; nonlinear simulation models; switch based nonlinear models; system level 3D ESD simulation; Electromagnetic compatibility; Electrostatic discharge; Integrated circuit modeling; Plastics; Solid modeling; Switches; computational electromagnetics; electrostatic discharge; nonlinear systems;
Conference_Titel :
EMC Europe 2011 York
Conference_Location :
York
Print_ISBN :
978-1-4577-1709-3
