• DocumentCode
    556125
  • Title

    A new binary input receiver highly immune to EMI

  • Author

    Bona, Calogero ; Fiori, Franco

  • Author_Institution
    Eln. Dept., Politec. di Torino, Torino, Italy
  • fYear
    2011
  • fDate
    26-30 Sept. 2011
  • Firstpage
    322
  • Lastpage
    327
  • Abstract
    This paper deals with the susceptibility of input digital frontend to EMI that, due to the rapid growth of the EM pollution and to the continuous decrease of the supply voltage, has become a major issue in system reliability. In this context, a new digital input frontend highly immune to RFI collected by PCB traces, connector leadframes and flexible buses is proposed. The proposed receiver is able to retrieve the nominal logic value of the transmitted binary data corrupted by EM disturbances and to estimate the EM disturbance amplitude affecting the binary input signal. The effectiveness of the proposed binary front-end circuit is proved through computer simulations.
  • Keywords
    integrated circuit reliability; radiofrequency interference; receivers; EM disturbances; EM pollution; EMI; PCB traces; RFI; binary front-end circuit; binary input receiver; connector leadframes; flexible buses; system reliability; Digital signal processing; Electromagnetic compatibility; Electromagnetic interference; Estimation; Integrated circuits; Random processes; Receivers; EM reliability; IC susceptibility; binary frontend; low voltage IC;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    EMC Europe 2011 York
  • Conference_Location
    York
  • Print_ISBN
    978-1-4577-1709-3
  • Type

    conf

  • Filename
    6078645