DocumentCode
556125
Title
A new binary input receiver highly immune to EMI
Author
Bona, Calogero ; Fiori, Franco
Author_Institution
Eln. Dept., Politec. di Torino, Torino, Italy
fYear
2011
fDate
26-30 Sept. 2011
Firstpage
322
Lastpage
327
Abstract
This paper deals with the susceptibility of input digital frontend to EMI that, due to the rapid growth of the EM pollution and to the continuous decrease of the supply voltage, has become a major issue in system reliability. In this context, a new digital input frontend highly immune to RFI collected by PCB traces, connector leadframes and flexible buses is proposed. The proposed receiver is able to retrieve the nominal logic value of the transmitted binary data corrupted by EM disturbances and to estimate the EM disturbance amplitude affecting the binary input signal. The effectiveness of the proposed binary front-end circuit is proved through computer simulations.
Keywords
integrated circuit reliability; radiofrequency interference; receivers; EM disturbances; EM pollution; EMI; PCB traces; RFI; binary front-end circuit; binary input receiver; connector leadframes; flexible buses; system reliability; Digital signal processing; Electromagnetic compatibility; Electromagnetic interference; Estimation; Integrated circuits; Random processes; Receivers; EM reliability; IC susceptibility; binary frontend; low voltage IC;
fLanguage
English
Publisher
ieee
Conference_Titel
EMC Europe 2011 York
Conference_Location
York
Print_ISBN
978-1-4577-1709-3
Type
conf
Filename
6078645
Link To Document