Optimization of an infrared sensor card for harsh environment purpose

In this paper methodology of the optimization of an IR (infrared) sensor card will be presented. This card will be used in harsh environment where the fast and accurate detection of the places of hot-spots through a contactless method is crucial during prototype testing. Several thermal simulations and hand-calculations were carried out to minimize the thermal time constant of the sensors. The simulation results were compared to the measurement results carried out by applying thermal transient tester. A thermal compact model of the sensor card will be introduced.