Title :
A multibackground march test for all static simple neighborhood pattern-sensitive faults in RAMs
Author :
Huzum, Cristina ; Cascaval, Petru
Author_Institution :
Fac. of Autom. Control & Comput. Eng., Gheorghe Asachi Tech. Univ. of Iasi, Iasi, Romania
Abstract :
Based on all realistic static two-cell coupling faults presented by Hamdioui, van de Goor, and Rodgers in [1], we have defined a complex model of neighborhood pattern sensitive faults (NPSFs) in N × 1 random-access memories [2]. Thus, the large model of NPSFs we have considered (called all static NPSFs) includes state coupling faults, transition coupling faults, write disturb coupling faults, read destructive coupling faults, deceptive read destructive coupling faults, and incorrect read coupling faults. A new multibackground march test able to cover this large model of NPSFs is presented in this paper.
Keywords :
random-access storage; RAM; deceptive read destructive coupling fault; multibackground march test; neighborhood pattern sensitive fault; random access memories; simple neighborhood pattern-sensitive fault; state coupling fault; static two-cell coupling faults; transition coupling fault; Arrays; Circuit faults; Computational modeling; Couplings; Fault detection; Integrated circuit modeling; Random access memory; Functional Fault Model; Memory Testing; Multibackground March Test; Neighborhood Pattern-Sensitive Faults; Static Faults;
Conference_Titel :
System Theory, Control, and Computing (ICSTCC), 2011 15th International Conference on
Conference_Location :
Sinaia
Print_ISBN :
978-1-4577-1173-2
