DocumentCode :
556831
Title :
Semiconductor manufacturing intelligence and key factor control mechanism for managing production cycle time
Author :
Chien, Chen-Fu ; Huang, Hung-Ya ; Chang, Kuo-Hao ; Lin, Yu-Cheng ; Liu, Tien-Hsian
fYear :
2011
fDate :
5-6 Sept. 2011
Firstpage :
1
Lastpage :
22
Abstract :
In the consumer era, the demand for more hot lots that enjoy differentiated cycle time service is increasing for semiconductor wafer fabrication. This study developed data mining techniques to explore the complex relationships between cycle times and related factors in a fab. Decision tree was constructed in manufacturing data mining to analyze key factor in the production cycle time. Using the IF THEN rules to control the factors. The explored patterns can support the decision making for managing production cycle time.
Keywords :
data mining; decision making; decision trees; production management; semiconductor industry; IF THEN rules; decision making; decision tree; differentiated cycle time service; key factor control mechanism; manufacturing data mining; production cycle time; semiconductor manufacturing intelligence; semiconductor wafer fabrication; Availability; Data mining; Decision trees; Fabrication; Supply chains;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing (ISSM) and e-Manufacturing and Design Collaboration Symposium (eMDC), 2011 International Symposium on
Conference_Location :
Hsinchu
ISSN :
1523-553X
Print_ISBN :
978-1-4577-1647-8
Type :
conf
Filename :
6086058
Link To Document :
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