Title :
Tool matching statistical methodology & application
Author_Institution :
Stat. Dev. & Applic. Dept., Taiwan Semicond. Manuf. Co., Hsinchu, Taiwan
Abstract :
Presents a collection of slides covering the following topics: tool matching; statistical methods and semiconductor manufacturing.
Keywords :
machine tools; semiconductor industry; statistical analysis; semiconductor manufacturing; statistical method; tool matching; Companies; Manufacturing processes; Production facilities; Qualifications; Statistical analysis;
Conference_Titel :
Semiconductor Manufacturing (ISSM) and e-Manufacturing and Design Collaboration Symposium (eMDC), 2011 International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4577-1647-8