Microwave imaging of the ceramic plate surface with the nanometer metal layer by means of the near-field microscope based on the Gunn-diode oscillator

The description of near-field microwave microscope based on the semiconductor Gunn-diode autodyne oscillator is presented. The probe of the microwave microscope was created on the base on the waveguide-to-microcoaxial adapter with centre conductor jutted out of the outer conductor. Using the created autodyne near-field microwave microscope the microwave imaging with high space resolution was demonstrated. The relief and electrophysical properties of the ceramic plate surface with applied metal layer were imaged with both direct access to the scanned object and in the mode of subsurface probing.