Title :
Calibration of the Non Linear Vector Network Analyzer (PNA-X) for probe measurements
Author :
Ouhachi, R. ; Gaquiere, D.D.C. ; Lacave, T. ; Chevalier, P. ; Gloria, Daniel
Author_Institution :
Microwave Power Devices Group, IEMN, Villeneuve-d´Ascq, France
Abstract :
In this paper, an original calibration procedure on wafer is described for Non Linear Vector Network Analyzer. The calibration is performed using the NVNA software on frequency domain up to 50 GHz. To validate the performances, measurements will be compared with LSNA on ST microelectronics HBT SiGe.
Keywords :
calibration; heterojunction bipolar transistors; millimetre wave integrated circuits; network analysers; probes; LSNA; NVNA software; PNA-X; ST microelectronics HBT; SiGe; calibration; non linear vector network analyzer; probe measurements; Calibration; Frequency measurement; Harmonic analysis; Microwave measurements; Microwave theory and techniques; Power measurement; Probes; LSNA; NVNA; Non Linear;
Conference_Titel :
Microwave Integrated Circuits Conference (EuMIC), 2011 European
Conference_Location :
Manchester
Print_ISBN :
978-1-61284-236-3
