DocumentCode :
558589
Title :
Cascode MOSFET-MESFET RF power amplifier on 150nm SOI CMOS technology
Author :
Ghajar, M. Reza ; Lepkowski, William ; Wilk, Seth ; Bakkaloglu, Bertan ; Boumaiza, Slim ; Thornton, Trevor
Author_Institution :
Arizona State Univ., Tempe, AZ, USA
fYear :
2011
fDate :
10-11 Oct. 2011
Firstpage :
316
Lastpage :
319
Abstract :
Metal-semiconductor-field-effect-transistors (MESFETs) have been fabricated using a 150 nm partially depleted silicon-on-insulator CMOS technology. A peak fT of 40 GHz and peak breakdown voltages of up to 12V were measured. Comparatively, the CMOS transistors on the same process have a maximum steady-state voltage limit of 1.95V. TOM3 model for MESFET developed in ADS. The demonstrated high cut-off frequency and high voltage operation capability make the SOI MESFET a good device candidate for integrated radio frequency (RF) power amplifiers (PA). A cascoded MOS-MES RF PA architecture is proposed and simulated in ADS using the TOM3 model. Simulation results show 75% PAE while delivering 24dBm output power.
Keywords :
CMOS integrated circuits; MOSFET; Schottky gate field effect transistors; power amplifiers; radiofrequency amplifiers; silicon-on-insulator; ADS simulation; CMOS transistors; SOI CMOS technology; TOM3 model; Triquint Own model; cascode MOSFET-MESFET RF power amplifier; frequency 40 GHz; metal-semiconductor-field-effect-transistors; size 150 nm; steady-state voltage limit; voltage 1.95 V; CMOS integrated circuits; Logic gates; MESFETs; Power amplifiers; Radio frequency; Semiconductor device modeling; MESFETs; Power Amplifiers (PA); silicon-on-insulator (SOI);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Integrated Circuits Conference (EuMIC), 2011 European
Conference_Location :
Manchester
Print_ISBN :
978-1-61284-236-3
Type :
conf
Filename :
6102911
Link To Document :
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