Title :
Design and verification of built-in-self-test (BIST) for RF, and Microwave applications
Author :
Elkassir, Bilal ; Wane, Sidina
Author_Institution :
NXP-Semicond., Esplanade Anton Philips, Colombelles Caen, France
Abstract :
This paper presents RF and Microwave BIST system for reconfigurability of on-chip function blocks. Design of BIST for on-chip functions is demonstrated based on design of scalable LNA gain (with digitally controlled attenuators), programmable automatic oscillation amplitude control of PLL reference VCOs and dynamic EVM estimation of IQ systems. In all aforementioned applications impacts of BIST circuits on system performances are evaluated based on simulation and experimental verifications.
Keywords :
attenuators; built-in self test; low noise amplifiers; microwave integrated circuits; phase locked loops; system-on-chip; voltage-controlled oscillators; IQ systems; LNA; PLL; RF BIST system; VCO; built-in-self-test; digitally controlled attenuators; dynamic EVM estimation; low noise amplifiers; microwave BIST system; on-chip function blocks; phase locked loops; programmable automatic oscillation amplitude control; voltage-controlled oscillators; Attenuators; Built-in self-test; Microwave circuits; Microwave oscillators; Phase locked loops; Radio frequency;
Conference_Titel :
Microwave Integrated Circuits Conference (EuMIC), 2011 European
Conference_Location :
Manchester
Print_ISBN :
978-1-61284-236-3
