Title :
Development of multifunction international roughness index and profile measuring device
Author :
Suksawat, Bandit
Author_Institution :
Dept. of Teacher Training in Mech. Eng., King Mongkut´´s Univ. of Technol. North Bangkok, Bangkok, Thailand
Abstract :
The development of a low cost multifunction measuring device is required for reduction of operation time and procedure in pavement quality inspection. This work aims to develop a multifunction international roughness index and profile measuring device. The developed device consists of hardware and software components. For the hardware components, open chain five bar linkage was designed for installation of variable resistors, encoder, angle sensor and interface card in order to measure road surface, traveling distance, slope of profile leveling and transfer measuring data, respectively. The software components consisted of IRI and profile computation programs created by LabVIEW program. The performance testing results exhibited a low average standard deviation of IRI and profile leveling measuring value. Thus, the developed device is suitable for measuring in the pavement quality inspection.
Keywords :
computerised instrumentation; couplings; geotechnical engineering; inspection; quality control; roads; sensors; structural engineering computing; surface roughness; LabVIEW program; angle sensor; encoder; hardware component; interface card; multifunction international roughness index; open chain five bar linkage; pavement quality inspection; profile computation program; profile measuring device; software component; variable resistors; Couplings; Resistors; Roads; Rough surfaces; Surface roughness; Surface topography; Testing; IRI measuring; Open chain mechanism; Pavement inspection; Profile measuring; Road surface roughness;
Conference_Titel :
Control, Automation and Systems (ICCAS), 2011 11th International Conference on
Conference_Location :
Gyeonggi-do
Print_ISBN :
978-1-4577-0835-0
