DocumentCode :
559784
Title :
Surface plasmon absorption topograph in a multi-layer Ti/Ag thin film by an optical beam scanning
Author :
Saiga, Noriaki ; Okamoto, Yoshihiro ; Matsumoto, Haruka
Author_Institution :
Dept. of Electron. Control Eng., Yonago Nat. Coll. of Technol., Yonago, Japan
fYear :
2011
fDate :
Oct. 30 2011-Nov. 2 2011
Firstpage :
1
Lastpage :
2
Abstract :
Surface plasmon polariton absorption was visualized over a large area of Ti/Ag thin film to observe the distribution of electron density. A converging light was incident on the surface at the angle of maximum absorption or some angles a little apart from it. The reflectance of the light showed up such an image as only the electron density distribution was in high contrast or the thickness variation of the film was enhanced. The calculation gave the qualitative verification of such imaging characteristics.
Keywords :
electron density; light reflection; metallic thin films; multilayers; polaritons; silver; surface plasmons; titanium; Ti-Ag; electron density distribution; film thickness variation; light reflectance; multilayer thin film; optical beam scanning; surface plasmon polariton absorption topograph; Argon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microopics Conference (MOC), 2011 17th
Conference_Location :
Sendai
Print_ISBN :
978-1-4577-1344-6
Type :
conf
Filename :
6110338
Link To Document :
بازگشت