• DocumentCode
    559939
  • Title

    Quality Control for High-Speed Digital Multi-layer Printed Circuit Board

  • Author

    Wu, Ningbiao ; Chen, Wenlu ; Jia, Yan ; Zhang, Yonghua

  • Author_Institution
    Jiangnan Inst. of Comput. Technol., Wuxi, China
  • Volume
    2
  • fYear
    2011
  • fDate
    24-25 Sept. 2011
  • Firstpage
    299
  • Lastpage
    304
  • Abstract
    This paper analyses the process technology and defects of high-speed digital circuit multi-layer print board, and provides a set of effective quality control solutions for product acceptance, reliability evaluation, storage management for computer and communication manufacturers. In addition to listing IPC standards in product acceptance, it also highlights the testing items and methods that should be concerned. The paper sums up the reliability evaluation to three aspects, and provides two kinds of advanced testing and evaluation methods. Case analysis shows that the testing data and results of metallographic observations are consistent. For increasingly high-frequency, high-density multi-layer printed circuit board high-speed digital circuits, its quality control should be taken seriously enough.
  • Keywords
    circuit testing; digital circuits; printed circuits; reliability; storage management; IPC standard; communication manufacturer; computer manufacturer; high-density multilayer printed circuit board; high-speed digital multilayer printed circuit board; metallographic observation; product acceptance; quality control solution; reliability evaluation; storage management; Conductors; Dielectrics; Impedance; Insulation; Reliability; Resistance; Testing; Characteristic impedance; Insulation reliability; Interconnect reliability; Multilayer printed circuit board;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Technology, Computer Engineering and Management Sciences (ICM), 2011 International Conference on
  • Conference_Location
    Nanjing, Jiangsu
  • Print_ISBN
    978-1-4577-1419-1
  • Type

    conf

  • DOI
    10.1109/ICM.2011.234
  • Filename
    6113527